ABES-V/VD System

Specification

• Logic burn-in Applications
  
• Logic burn-in Applications
  
• IC burn-in with test complying with IEEE Standard 1149.
  
• Logic, memory, analog, and mixed signal burn-in with test.
  
• Memory burn-in Applications
  
• QA and engineering memory burn-in with test.
  
• Production memory burn-in with test.
  

Features

• ABES-V/VD Features
  
• Up to 256 disital I/O channels per burn-in board.
  
• Tests 256 pins simultaneously.
  
• Memory testing capability.
  
• 1, 2, 4, or 8 pattern zones
  
• 5 programmable voltage regulators per burn-in board (3 are 40-amp regultors).
  
• Up to 130 amps of programmable power to the devices under test (5 seperate votages).
  
• Optional high-power burn-in for devices up to 20 Watts.
  
• 8 analog generators per burn-in board (optional).
  
• Large system capacity of up to 32 burn-in board;Large burn-in boards with 20.25 inches x 21.5 inches of socket space.
  
• Memory testing capability including refresh.
  
• 12 vector formats per pin per cycle.
  
• 1-nanosecond clock resolution.
  
• Boolean address scrambling.
  
• 2K real-time error log sets of timing on the fly.